Conceptual design of new polychromator on Thomson scattering system to measure Zeff.
Conceptual design of new polychromator on Thomson scattering system to measure Zeff.
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DOI：
10.1063/1.4733737
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发表时间：
2012-07
期刊：
影响因子：
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通讯作者：
Jongha Lee;Seungtae Oh;H. Wi;Y. Oh;I. Yamada;K. Narihara;K. Kawahata;J. Jeon
中科院分区：
文献类型：
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作者：
Jongha Lee;Seungtae Oh;H. Wi;Y. Oh;I. Yamada;K. Narihara;K. Kawahata;J. Jeon
为了在KSTAR托卡马克同一位置同时测量电子温度（T(e)）和电子密度（n(e)）分布的Z(eff)，我们设计了一种新的具有附加功能的汤姆逊散射系统多色仪。附加功能是测量轫致辐射强度，以计算独立于汤姆逊信号的Z（eff）。为此，我们设计并制作了中心波长为523 nm和FWHM为2 nm的准直透镜组和干涉滤光片。最后，我们在KSTAR边缘汤姆逊散射多色仪上更换了透镜、检测二极管，并增加了韧致辐射滤波器。然后用钨丝灯和单色仪对这种新型多色仪进行了测试。
To measure the Z(eff) with electron temperature (T(e)) and electron density (n(e)) profiles at the same time and the same position in the KSTAR tokamak, we design a new polychromator for Thomson scattering system that has additional function. The additional function is measuring bremsstrahlung intensity to calculate Z(eff) independent of Thomson signals. For this new polychromator, we design and fabricate a collimation lens set, and interference filter that has center wavelength of 523 nm and 2 nm FWHM. Finally, we change the lenses, detector diodes, and add the bremsstrahlung filter on the KSTAR edge Thomson scattering polychromator. Then this new polychromator was tested by Tungsten light and monochromator.