Development of a synchrotron powder diffractometer with a one-dimensional X-ray detector for analysis of advanced materials
Development of a synchrotron powder diffractometer with a one-dimensional X-ray detector for analysis of advanced materials
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DOI：
10.2109/jcersj2.121.287
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发表时间：
2013-03-01
影响因子：
1.1
通讯作者：
Sakata, Osami
中科院分区：
文献类型：
--
作者：
Tanaka, Masahiko;Katsuya, Yoshio;Sakata, Osami
为实现高角分辨率、高效率、全自动粉末x射线衍射实验，研制了一种新型同步加速器x射线衍射仪。样品到探测器的距离设计为955毫米。这段较长的距离使我们能够获得高角分辨率的粉末衍射数据。一维探测器每次曝光可以在2 θ角上观察到3.84度，因此每2 θ角需要多次曝光才能收集到完整的粉末衍射图。2的最小步长约为0.003度。采用新开发的覆盖整个系统的衍射仪控制程序，实现了全自动数据采集系统；一个样品交换器，一个样品位置调整，衍射仪轴和数据收集。衍射峰轮廓和角分辨率与相同样品到探测器距离的成像板德拜-谢勒相机相当。用Rietveld法对该系统获得的标准样品（NIST-CeO2）的衍射数据进行了分析。(C) 2013日本陶瓷学会。版权所有。
A new synchrotron X-ray diffractometer with a one-dimensional X-ray detector has been successfully developed for the purpose of high angular resolution, high efficiency and full automatic powder X-ray diffraction experiments. Sample-to-detector distance is designed to be 955 mm. This long distance enables us to obtain high angular resolution powder diffraction data. The one-dimensional detector can observe 3.84 degrees in 2 theta per one exposure, thus multiple exposures at every 2 theta angle are required to collect a whole powder diffraction pattern. The minimum step size of 2 theta is approximately 0.003 degrees. A full automatic data-collection system is achieved with a newly developed diffractometer control program that covers the whole system; a sample exchanger, a sample position adjustment, diffractometer axes and data collection. Diffraction peak profile and angular resolution are comparable to that of the imaging plate Debye-Scherrer camera with the same sample-to-detector distance. Diffraction data of a standard sample (NIST-CeO2) obtained by this system was analyzed properly using Rietveld method. (C) 2013 The Ceramic Society of Japan. All rights reserved.