High contrast reflectance imaging at 1950 nm for the assessment of lesion activity on extracted teeth.
High contrast reflectance imaging at 1950 nm for the assessment of lesion activity on extracted teeth.
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1950 nm 处的高对比度反射成像，用于评估拔除牙齿上的病变活动。
DOI：
10.1117/12.2584909
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发表时间：
2021
期刊：
影响因子：
--
通讯作者：
Fried,Daniel
中科院分区：
文献类型：
--
作者：
Tressel,John;Abdelaziz,Marwa;Fried,Daniel
在1500-2340 nm和1950-nm处测量拔牙近端表面病变反射率的变化。采用长通滤光片的增程钨卤灯（1500-2340 nm）和以1950-nm吸水带峰附近为中心的宽带ASE光源作为光源，采用增程InGaAs相机（1000-2340-nm）在空气干燥过程中获取反射光图像。1950-nm的SWIR光产生极高的脱矿对比度，似乎是评估牙齿冠状表面病变活动的最佳波长。
Changes in the reflectivity of lesions on the proximal surfaces of extracted human teeth were measured at 1500-2340-nm and at 1950-nm as they were dried with air. An extended range tungsten-halogen lamp with a long pass filter (1500-2340-nm) and a broadband ASE source centered near the peak of the water-absorption band at 1950-nm were used as light sources and an extended range InGaAs camera (1000-2340-nm) was used to acquire reflected light images as the samples were dried with air. SWIR light at 1950-nm yields extremely high contrast of demineralization and appears to be the optimum wavelength for the assessment of lesion activity on tooth coronal surfaces.