Gas and heat dynamics of a micro-scaled atmospheric pressure plasma reference jet
Gas and heat dynamics of a micro-scaled atmospheric pressure plasma reference jet
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DOI：
10.1088/0022-3727/48/44/444002
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发表时间：
2015-10
期刊：
影响因子：
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通讯作者：
S. Kelly;J. Golda;M. Turner;V. D. Gathen
中科院分区：
文献类型：
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作者：
S. Kelly;J. Golda;M. Turner;V. D. Gathen
研究了欧洲领先的低温大气压等离子体参考装置“COST参考微等离子体射流”（COST-jet）的气体动力学和热动力学。特别感兴趣的许多生物医学应用场景中，由射流影响的表面的温度特性被揭示。采用纹影成像、热电偶测量、红外热成像和数值模拟。在气体域的温度空间分布揭示加热主要是氦部分的气体混合物。热电偶和模型的时间数据表明，一个单一的特征时间参数描述的有界指数温度增长，达到63%或（1-1/e）分数的温度增加。峰值温度出现在载流射流离开COST射流的气体区域中，其值范围从环境温度到“α模式”操作中超过100 °C。在COST-射流的水平取向中，氦气流出物在低气体流量下的弯曲轨迹由浮力引起。气体混合物的配置文件显示显着的遏制氦浓度的表面放置在靠近成本喷气。石英板的表面加热遵循与设备加热类似的有界指数时间温度增长。表面加热的空间分布被发现强烈相关的影响流出物的峰值温度发生在最大表面氦浓度的区域。
Gas and heat dynamics of the ‘Cooperation on Science and Technology (COST) Reference Microplasma Jet’ (COST-jet), a European lead reference device for low temperature atmospheric pressure plasma application, are investigated. Of particular interest to many biomedical application scenarios, the temperature characteristics of a surface impacted by the jet are revealed. Schlieren imaging, thermocouple measurements, infrared thermal imaging and numerical modelling are employed. Temperature spatial profiles in the gas domain reveal heating primarily of the helium fraction of the gas mixture. Thermocouple and model temporal data show a bounded exponential temperature growth described by a single characteristic time parameter to reach ∼63% or (1-1/e) fraction of the temperature increase. Peak temperatures occurred in the gas domain where the carrier jet exits the COST-jet, with values ranging from ambient temperatures to in excess of 100 °C in ‘α-mode’ operation. In a horizontal orientation of the COST-jet a curved trajectory of the helium effluent at low gas flows results from buoyant forces. Gas mixture profiles reveal significant containment of the helium concentrations for a surface placed in close proximity to the COST-jet. Surface heating of a quartz plate follows a similar bounded exponential temporal temperature growth as device heating. Spatial profiles of surface heating are found to correlate strongly to the impacting effluent where peak temperatures occur in regions of maximum surface helium concentration.