Proton transport and microstructure properties in superlattice thin films fabricated by pulsed laser deposition
Proton transport and microstructure properties in superlattice thin films fabricated by pulsed laser deposition
复制标题
DOI：
10.1143/jjap.44.8613
复制
发表时间：
2005-12-01
期刊：
影响因子：
--
通讯作者：
Yugami, H
中科院分区：
文献类型：
--
作者：
Kuwata, N;Sata, N;Yugami, H
采用脉冲激光沉积法制备了钙钛矿型氧化物质子导体SrZr0.95Y0.05O3/SrTiO 3超晶格薄膜。报道了它们的结构和质子输运性质。X射线衍射和选区电子衍射分析表明，薄膜是在MgO（001）衬底上外延生长的。高分辨电子显微镜观察到高密度的边缘位错和柱状结构的薄膜。薄膜的面内电导率由阻抗谱测定。通过H2O/D2 O交换测量证实了质子输运对薄膜总电导率的贡献。通过引入异质界面提高了超晶格薄膜的导电性。高激活能（E-a = 1.0eV）的原因是薄膜中柱状结构的晶界效应。
Superlattice thin films of the perovskite-type oxide proton conductor SrZr0.95Y0.05O3/SrTiO3 was fabricated by pulsed laser deposition. Their structural and proton transport properties were reported. X-ray diffraction analysis and selected area electron diffraction revealed that the thin films were epitaxially grown on MgO(001) substrate. High-density edge dislocations and a columnar structure were observed in the films by high-resolution electron microscopy. The in-plane electrical conductivity of the thin films was determined by impedance spectroscopy. The contribution of proton transport to the total conductivity of the films was confirmed by H2O/D2O exchange measurement. The conductivity of superlattice films was increased by introducing heterointerfaces. The high activation energy (E-a = 1.0eV) was explained by the grain-boundary effect of the columnar structure in the films.