Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip
Atomic Force Microscopy of Single-Walled Carbon Nanotubes Using Carbon Nanotube Tip
复制标题
使用碳纳米管尖端的单壁碳纳米管原子力显微镜
DOI：
10.1143/jjap.39.3707
复制
发表时间：
2000
影响因子：
1.5
通讯作者：
H. Tokumoto
中科院分区：
文献类型：
--
作者：
N. Choi;T. Uchihashi;H. Nishijima;T. Ishida;W. Mizutani;S. Akita;Y. Nakayama;M. Ishikawa;H. Tokumoto
我们成功地观察到单个单壁碳纳米管（SWNTs）使用原子力显微镜（AFM）在轻敲模式下，注意样品和AFM针尖的制备。为了解开单壁碳纳米管束，我们在N，N-二甲基甲酰胺中加入了少量的胺。为了实现高分辨率的扫描模式AFM成像，我们使用碳纳米管（CNT）的尖端，其半径可以减少。我们能够使用CNT尖端对单个单壁碳纳米管成像，其宽度是使用传统硅尖端成像的宽度的一半。有了这种提高的分辨率，我们可以清楚地解决两个单壁碳纳米管平行放置在云母基板。
We succeeded in observing individual single-walled carbon nanotubes (SWNTs) using an atomic force microscope (AFM) in the tapping mode by paying attention to the preparation of both samples and AFM tips. To disentangle the bundles of SWNTs, we added a small amount of amine into N,N-dimethylformamide. To achieve a high resolution in tapping-mode AFM imaging, we used carbon nanotube (CNT) tips whose radii could be reduced. We were able to image individual SWNTs using CNT tips with widths that were half of those imaged using conventional silicon tips. With this improved resolution, we could clearly resolve the two SWNTs lying parallel on a mica substrate.
影响因子：
8.6
作者：
Bezryadin, A;Verschueren, ARM;Dekker, C
通讯作者：
Dekker, C