Rapid computation of the amplitude and phase of tightly focused optical fields distorted by scattering particles.
Rapid computation of the amplitude and phase of tightly focused optical fields distorted by scattering particles.
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DOI：
10.1364/josaa.31.001520
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发表时间：
2014-07-01
期刊：
影响因子：
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通讯作者：
Venugopalan V
中科院分区：
文献类型：
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作者：
Ranasinghesagara JC;Hayakawa CK;Davis MA;Dunn AK;Potma EO;Venugopalan V
我们开发了一种有效的方法，用于精确计算电场的紧聚焦激光束中存在的特定配置的微观散射体。这种基于惠更斯-菲涅耳波的电场叠加（HF-WEFS）方法计算散射电场的振幅和相位，与麦克斯韦方程的时域有限差分（FDTD）解非常一致。我们的HF-WEFS实现速度比FDTD方法快2-4个数量级，并能够系统地研究散射体尺寸和配置对焦场的影响。我们展示了新的HF-WEFS方法的权力，通过映射几个指标的焦场失真作为散射体位置的函数。该分析表明，最大的焦场失真发生在放置在焦平面下方的单个散射体与光轴的偏移。HF-WEFS方法是发展厚细胞/组织标本的激光扫描显微镜计算模型的重要的第一步。
We develop an efficient method for accurately calculating the electric field of tightly focused laser beams in the presence of specific configurations of microscopic scatterers. This Huygens–Fresnel wave-based electric field superposition (HF-WEFS) method computes the amplitude and phase of the scattered electric field in excellent agreement with finite difference time-domain (FDTD) solutions of Maxwell’s equations. Our HF-WEFS implementation is 2–4 orders of magnitude faster than the FDTD method and enables systematic investigations of the effects of scatterer size and configuration on the focal field. We demonstrate the power of the new HF-WEFS approach by mapping several metrics of focal field distortion as a function of scatterer position. This analysis shows that the maximum focal field distortion occurs for single scatterers placed below the focal plane with an offset from the optical axis. The HF-WEFS method represents an important first step toward the development of a computational model of laser-scanning microscopy of thick cellular/tissue specimens.