Quantitative analysis of metallic artifacts caused by dental metals: comparison of cone-beam and multi-detector row CT scanners
Quantitative analysis of metallic artifacts caused by dental metals: comparison of cone-beam and multi-detector row CT scanners
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DOI：
10.1007/s11282-011-0071-z
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发表时间：
2011-12-01
期刊：
影响因子：
2.2
通讯作者：
Furukawa, Souhei
中科院分区：
文献类型：
--
作者：
Chindasombatjaroen, Jira;Kakimoto, Naoya;Furukawa, Souhei
目的定量比较牙科金属在锥形束计算机断层扫描（CBCT）设备和多探测器行计算机断层扫描（MDCT）扫描仪中产生的条纹伪影与金属类型和成像参数的关系。方法用CBCT和MDCT扫描仪在80和100 kV（kVp）峰值管电压下扫描铝、钛、钴铬合金和IV型金合金立方体。MDCT的电流为100和170 mA，CBCT的电流为102和170 mA。结果在大多数情况下，相同金属材料和成像参数下，CBCT的扫描面积均小于MDCT。IV型金合金引起的伪影面积最大，其次分别是钴铬合金、钛和铝。在大多数情况下，较高的管电压与较小的伪影面积相关，而增加管电流对伪影面积没有一致的影响，使用任何CT设备。结论CBCT与较小的伪影面积比MDCT相同的参数。IV型金合金在测试的金属中产生最大的伪影区域，但金属伪影可以通过增加管电压来减少。
Objectives To quantitatively compare the streak artifacts produced by dental metals in a cone-beam computed tomography (CBCT) device and a multi-detector row computed tomography (MDCT) scanner in relation to metal types and imaging parameters.Methods Cubes of aluminum, titanium, cobalt-chromium alloy, and type IV gold alloy were scanned with CBCT and MDCT scanners at tube voltages of 80 and 100 peak kV (kVp), and currents of 100 and 170 mAs by MDCT, and 102 and 170 mAs by CBCT. Artifact areas were quantified using ImageJ software.Results Artifact areas for the same metals and imaging parameters were smaller with CBCT than with MDCT under most conditions. Type IV gold alloy caused the largest artifact areas, followed by cobalt-chromium alloy, titanium, and aluminum, respectively. Higher tube voltage was associated with smaller artifact areas under most conditions, whereas increasing tube current had no consistent effect on artifact area using either CT device.Conclusions CBCT was associated with smaller artifact areas than MDCT for the same parameters. Type IV gold alloy produced the largest artifact areas among the tested metals, but metallic artifacts could be reduced by increasing the tube voltage.