Impact of Cable Twist Pitch on $T_{cs}$ -Degradation and AC Loss in $\hbox{Nb}_{3}\hbox{Sn}$ Conductors for ITER Central Solenoids

Impact of Cable Twist Pitch on $T_{cs}$ -Degradation and AC Loss in $\hbox{Nb}_{3}\hbox{Sn}$ Conductors for ITER Central Solenoids
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DOI:
10.1109/tasc.2013.2284193
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发表时间:
2014-06
影响因子:
1.8
通讯作者:
Y. Nabara;T. Hemmi;H. Kajitani;H. Ozeki;T. Suwa;M. Iguchi;Y. Nunoya;T. Isono;K. Matsui;N. Koizumi;F. Tsutsumi;Y. Uno;M. Oshikiri;K. Shibutani;Y. Takahashi;K. Okuno;Y. Murakami;T. Miyatake;M. Sugimoto;A. Takagi;Y. Nakada;K. Miyashita;K. Sedlák;B. Stepanov;P. Bruzzone
Y. Nabara;T. Hemmi;H. Kajitani;H. Ozeki;T. Suwa;M. Iguchi;Y. Nunoya;T. Isono;K. Matsui;N. Koizumi;F. Tsutsumi;Y. Uno;M. Oshikiri;K. Shibutani;Y. Takahashi;K. Okuno;Y. Murakami;T. Miyatake;M. Sugimoto;A. Takagi;Y. Nakada;K. Miyashita;K. Sedlák;B. Stepanov;P. Bruzzone
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Y. Nabara;T. Hemmi;H. Kajitani;H. Ozeki;T. Suwa;M. Iguchi;Y. Nunoya;T. Isono;K. Matsui;N. Koizumi;F. Tsutsumi;Y. Uno;M. Oshikiri;K. Shibutani;Y. Takahashi;K. Okuno;Y. Murakami;T. Miyatake;M. Sugimoto;A. Takagi;Y. Nakada;K. Miyashita;K. Sedlák;B. Stepanov;P. Bruzzone

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对ITER中心超导体的四种Nb3Sn导体进行了性能测试。在大约9000次电磁循环中测量电流共享温度(Tcs),包括在4.2K和室温之间的两个或三个热循环。在整个循环过程中,Tcs增加并变得几乎恒定。电场对温度的梯度随着循环的进行而逐渐减小。短捻距导线的电磁力引起的劣化小于原捻距导线。短捻距导线的交流损耗是原捻距导线的几倍。在布线过程中形成的股线上的铬镀层的凹陷和去除降低了股线之间的电阻,这可能导致观察到的高交流损耗。电缆检查表明,电缆横截面没有明显的偏移,侧面也没有扭曲的股线。短捻距电缆的高刚度可以防止这些塑性变形,所述塑性变形由洛伦兹力引起。
The performance of four Nb3Sn conductors for the ITER central solenoids was tested. The current sharing temperatures (Tcs) were measured over approximately 9000 electromagnetic cycles, including two or three thermal cycles between 4.2 K and room temperature. Tcs increased and became almost constant through the cycling. The gradient of the electric field against the temperature gradually decreased against cycling. The degradations caused by the electromagnetic force of the short twist pitch conductors were smaller than that of the original twist pitch conductor. The ac losses of short twist pitch conductors were several times higher than that of original twist pitch conductor. The dents and the removals of the Cr plating on the strands, which were formed during cabling, decreased the electric resistance between strands, which may cause the observed high ac loss. Inspection of the cable showed neither a clear bias of cable in the cross-sectional surface nor distorted strands in the lateral face. The high rigidity of the short twist pitch cable could prevent these plastic deformations, caused by the Lorentz force.