Accurate determination of temperature dependent full matrix parameters of piezoelectric materials using only one sample
Accurate determination of temperature dependent full matrix parameters of piezoelectric materials using only one sample
复制标题
仅使用一个样品即可准确测定压电材料的温度相关全矩阵参数
DOI：
10.1016/j.ceramint.2020.04.192
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发表时间：
2020
影响因子：
5.2
通讯作者：
Zhang Rui
中科院分区：
文献类型：
--
作者：
Huo Da;Zheng Limei;Qi Xudong;Su Wenbin;Lu Xiaoyan;Zhao Minglei;Wang Chun-Ming;Wang Xuping;Zhang Yuanyuan;Zhang Rui
使用尽可能少的样品准确确定压电材料的完整基体参数非常重要。在这里，我们采用了一种简单且广泛适用的方法来准确确定[001]C极化K(Ta,Nb)O3单晶的完整基体参数。整个实验过程仅使用一个样品，消除了多样品测试的不一致性。我们还通过反转两个不等晶体方向[001]C和[010]C的阻抗谱来提高结果的准确性。基于这一技术，使用一个样品获得了完整矩阵参数随温度的变化。该工作对于新型压电材料的表征以及压电器件在不同温度下的性能评估具有重要意义。
It is of great importance to accurately determine the full matrix parameters of the piezoelectric materials using as few samples as possible. Here we performed a simple and widely applicable method to accurately determine the full matrix parameters of [001]C-poled K(Ta,Nb)O3single crystal. Only one sample was used throughout the experiment procedure, which eliminated inconsistency from multi-sample testing. We also improved the accuracy of results by inversing the impedance spectra of two inequivalent crystallographic directions, [001]Cand [010]C. Based on this technique, variation of full matrix parameters with temperature were obtained using one sample. This work is of great significance for the characterization of novel piezoelectric materials and the evaluation of the performance of piezoelectric devices at various temperature.