Spin- and angle-resolved photoemission studies of the electronic structure of Si(110)“ 16×2 ” surfaces
Spin- and angle-resolved photoemission studies of the electronic structure of Si(110)“ 16×2 ” surfaces
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Si(110)—16—2—表面电子结构的自旋和角度分辨光发射研究
DOI:
10.1103/physrevb.100.075302
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发表时间:
2019
影响因子:
3.7
通讯作者:
Flavell, W. R.
中科院分区:
文献类型:
--
作者:
Lewis, N. K.;Lassailly, Y.;Martinelli, L.;Vobornik, I.;Fujii, J.;Bigi, C.;Brunkow, E.;Clayburn, N. B.;Gay, T. J.;Flavell, W. R.
The electronic structure of Si(110)“” double-domain, single-domain, andsurfaces have been investigated using spin- and angle-resolved photoemission at sample temperatures ofand. Angle-resolved photoemission was conducted using horizontally and vertically polarizedandphotons. Band-dispersion maps revealed four surface states (to) which were assigned to silicon dangling bonds on the basis of measured binding energies and photoemission intensity changes between horizontal and vertical light polarizations. Three surface states (, and), observed in the Si(110)“” reconstruction, were assigned to Si adatoms and Si atoms present at the edges of the corrugated terrace structure. Only one of the four surface states,, was observed in both the Si(110)“” andband maps and consequently attributed to the pervasive Si zigzag chains that are components of both the Si(110)“” andsurfaces. A state in the bulk-band region was attributed to an in-plane bond. All data were consistent with the adatom-buckling model of the Si(110)“” surface. Whilst room temperature measurements ofandwere statistically compatible with zero,measurements of the enantiomorphic A-type and B-type Si(110)“” surfaces gave small average polarizations of around 1.5% that were opposite in sign. Further measurements aton A-type Si(110)“” surfaces gave a smaller value of%. An upper limit ofmay thus be taken for the longitudinal polarization.