Mass fragmentographic studies of sulfur compounds: the thienylthiaalkanes.
Mass fragmentographic studies of sulfur compounds: the thienylthiaalkanes.
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硫化合物的质量碎片研究：噻吩基硫烷。
DOI：
10.1002/bms.1200010502
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发表时间：
1974
期刊：
影响因子：
--
通讯作者：
R. W. Higgins
中科院分区：
文献类型：
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作者：
N. G. Foster;D. W. Shiu;R. W. Higgins
描述了对化石燃料研究中重要的 24 种高纯度化合物的质谱裂解研究。这些物质包括十一种 1-(2-噻吩基)-1-硫杂、六种 1-(2-噻吩基)-3-硫杂和七种 1-(2-噻吩基)-4-硫杂烷烃，分子量范围为 158 至 270。重排峰在所有光谱中都很突出，并形成 1-硫杂和 4-硫杂化合物的基峰。 3-硫杂环化合物在表现出较弱的重排峰和大离子强度（包括基峰）方面有些反常，在典型的烷基片段、烯基片段或硫代烷烃（脂肪族硫化物）更具有特征的离子的质量下。讨论了主要碎片离子并描述了它们在区分子类中的用途。提供低电离电压数据以支持建议的碎片机制。
Fragmentation studies of the mass spectra of 24 high purity compounds of importance in a study of fossil fuels are described. The substances include eleven 1-(2-thienyl)-1-thia-, six1-(2-thienyl)-3-thia, and seven1-(2-thienyl)-4-thiaalkanes in the molecular weight range 158 to 270. Rearrangement peaks are prominent in all spectra and form the base peaks for the 1-thia- and 4-thia- compounds. The 3-thia- compounds are somewhat perverse in exhibiting weaker rearrangement peaks, and large ion intensities, including base peaks, at masses typical of alkyl fragments, alkenyl fragments, or ions more characteristic of the thiaalkanes (aliphatic sulfides). The major fragment ions are discussed and their use in differentiating subclasses is described. Low ionization voltage data is presented in support of suggested mechanisms of fragmentation.