Solid-state-biased coherent detection of ultra-broadband terahertz pulses
Solid-state-biased coherent detection of ultra-broadband terahertz pulses
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DOI：
10.1364/optica.4.001358
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发表时间：
2017-11
期刊：
影响因子：
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通讯作者：
A. Tomasino;A. Mazhorova;M. Clerici;M. Peccianti;Sze;H. Phing;Y. Jestin;A. Pasquazi;A. Markov
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文献类型：
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作者：
A. Tomasino;A. Mazhorova;M. Clerici;M. Peccianti;Sze;H. Phing;Y. Jestin;A. Pasquazi;A. Markov
非线性和超快光学领域的重大进展最近为太赫兹 (THz) 科学技术带来了令人兴奋的新机遇，这需要开发可靠的太赫兹源、探测器和支持设备。在这项工作中，我们展示了第一种用于超宽带太赫兹脉冲（0.1-10太赫兹）相干检测的固态技术，该技术依赖于紫外线熔融石英薄层中电场感应的二次谐波产生。所提出的 CMOS 兼容器件可以通过标准微加工技术实现，使我们能够通过采用远低于气体技术中使用的探测激光功率和偏置电压来执行高动态范围的超宽带检测。最终，这可能为使用高重复率超快激光器和商用电子设备进行超短太赫兹脉冲的相干检测铺平道路。
Significant progress in nonlinear and ultrafast optics has recently opened new and exciting opportunities for terahertz (THz) science and technology, which require the development of reliable THz sources, detectors, and supporting devices. In this work, we demonstrate the first solid-state technique for the coherent detection of ultra-broadband THz pulses (0.1–10 THz), relying on the electric-field-induced second-harmonic generation in a thin layer of ultraviolet fused silica. The proposed CMOS-compatible devices, which can be realized with standard microfabrication techniques, allow us to perform ultra-broadband detection with a high dynamic range by employing probe laser powers and bias voltages much lower than those used in gas-based techniques. Eventually, this may pave the way for the use of high-repetition-rate ultrafast lasers and commercially available electronics for the coherent detection of ultrashort THz pulses.