Novel Interferometer in the Soft X-Ray Region
Novel Interferometer in the Soft X-Ray Region
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软 X 射线区域的新型干涉仪
DOI：
10.1103/physrevlett.80.5473
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发表时间：
1998
影响因子：
8.6
通讯作者：
T. Walcher
中科院分区：
文献类型：
--
作者：
S. Dambach;H. Backe;T. Doerk;N. Eftekhari;H. Euteneuer;F. Görgen;F. Hagenbuck;K. Kaiser;O. Kettig;G. Kube;W. Lauth;H. Schöpe;A. Steinhof;T. Tonn;T. Walcher
研制了一种新型的干涉仪，用于测量真空紫外和软x射线波段的自支撑薄膜的复折射率。它由两个共线波荡器和一个光栅光谱仪组成。利用来自美因茨微波加速器的低发射度855 MeV电子束，观察到了不同的强度振荡作为波荡器之间距离的函数。放置在波动器之间的箔引起相移和振荡幅度的衰减。在碳的K吸收边测量了复折射率。共振反常X射线散射在物理学、生物学和材料科学的许多学科中发挥着越来越重要的作用。利用现代同步辐射光源发出的明亮的可调谐X射线束，现在可以充分利用吸收边附近原子散射振幅fsv，$ qd <$f0s $ qd 1 f 0 svd 1 if 00 svd的强能量和偏振依赖性中的信息[1]。这是原子的散射振幅与自由（汤姆逊）电子的散射振幅之比。它可以分为与能量无关的“正常”相干散射振幅f0 s $ qd和
A novel interferometer has been developed with which the complex index of refraction of thin self-supporting foils can be measured in the vacuum ultraviolet and soft x-ray region. It consists of two collinear undulators and a grating spectrometer. Taking advantage of the low emittance 855 MeV electron beam from the Mainz Microtron, distinct intensity oscillations have been observed as a function of the distance between the undulators. A foil placed between the undulators causes a phase shift and an attenuation of the oscillation amplitude. The complex index of refraction has been measured at the K-absorption edge of carbon. [S0031-9007(98)06368-6] Resonant anomalous x-ray scattering plays an increasingly important role in many disciplines of physics, biology, and material sciences. Using the brilliant and tunable x-ray beams from modern synchrotron radiation sources, it is now possible to fully exploit the information in the strong energy and polarization dependence of the atomic scattering amplitude fsv, $ qd › f0s $ qd 1 f 0 svd 1 if 00 svd near absorption edges [1]. This is the ratio of the scattering amplitude of an atom to that of a free (Thomson) electron. It can be separated in an energy independent “normal” coherent scattering amplitude f0s $ qd and an