Passive Micron-Scale Time-of-Flight with Sunlight Interferometry
Passive Micron-Scale Time-of-Flight with Sunlight Interferometry
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DOI：
10.1109/cvpr52729.2023.00403
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发表时间：
2022-11
期刊：
影响因子：
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通讯作者：
Alankar Kotwal;Anat Levin;Ioannis Gkioulekas
中科院分区：
文献类型：
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作者：
Alankar Kotwal;Anat Levin;Ioannis Gkioulekas
我们介绍了一种用于被动飞行时间成像和深度传感的干涉技术。我们的技术使用了一种全视场迈克尔逊干涉仪，改进后使用太阳光作为唯一的光源。太阳光的大光谱带宽使得通过简单的轴向扫描操作获得微米分辨率的时间分辨场景响应成为可能。此外，太阳光的角带宽使得捕获对间接照明效应不敏感的飞行时间测量成为可能，例如间反射和地下散射。我们建立了一个实验原型，我们在户外操作，在阳光直射下，在恶劣的环境条件下，如机器振动和车辆交通。我们使用该原型首次展示了被动成像功能，如微米级深度感测，对间接照明，直接成像和通过扩散器成像具有鲁棒性。
We introduce an interferometric technique for passive time-of-flight imaging and depth sensing at micrometer axial resolutions. Our technique uses a full-field Michelson interferometer, modified to use sunlight as the only light source. The large spectral bandwidth of sunlight makes it possible to acquire micrometer-resolution time-resolved scene responses, through a simple axial scanning operation. Additionally, the angular bandwidth of sunlight makes it possible to capture time-of-flight measurements insensitive to indirect illumination effects, such as interreflections and subsurface scattering. We build an experimental prototype that we operate outdoors, under direct sunlight, and in adverse environment conditions such as machine vibrations and vehicle traffic. We use this prototype to demonstrate, for the first time, passive imaging capabilities such as micrometer-scale depth sensing robust to indirect illumination, direct-only imaging, and imaging through diffusers.