Characterisation of interfaces in nanocrystalline palladium
Characterisation of interfaces in nanocrystalline palladium
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纳米晶钯界面的表征
DOI：
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发表时间：
2003
期刊：
影响因子：
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通讯作者：
V. S. Raghunathan
中科院分区：
文献类型：
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作者：
R. Divakar;V. S. Raghunathan
纳米晶材料中的晶界和三线结的结构是令人感兴趣的，因为纳米晶材料中的大部分原子处于这些界面位置。利用高分辨率透射电子显微镜（HRTEM）研究了纳米钯的晶界和三线结结构。观察到的主要微观结构特征包括不同的晶界原子结构和三线结处的无序区域的存在。此外，在不同的纳米晶晶粒的晶格参数的变化。几何相位分析用于量化纳米晶晶粒内的原子位移。这样检测到的位移场指示到界面结构的链接。
Structures of grain boundaries and triple line junctions in nanocrystalline materials are of interest owing to large fractions of atoms in nanocrystalline materials being at these interfacial positions. Grain boundary and triple line junction structures in nanocrystalline palladium have been studied using high-resolution transmission electron microscopy (HRTEM). The main micro structural features observed include the varying atomic structures of grain boundaries and the presence of disordered regions at triple line junctions. Also, there is variation in lattice parameters in different nanocrystalline grains. Geometric phase analysis is used to quantify atomic displacements within nanocrystalline grains. Displacement fields thus detected indicate links to the interface structures.