A Finite Element Study on the Grain Boundary Impedance of Different Microstructures
A Finite Element Study on the Grain Boundary Impedance of Different Microstructures
复制标题
不同微观结构晶界阻抗的有限元研究
DOI：
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发表时间：
1998
期刊：
影响因子：
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通讯作者：
J. Maier
中科院分区：
文献类型：
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作者：
Juergen Fleig;J. Maier
砖层模型由于其简单性，常用于分析陶瓷的阻抗谱。事实上，这样的模型并不能代表材料的真实微观结构。在这篇文章中，我们研究了偏离理想模型如何影响低导晶界的整体阻抗。有限元计算表明，即使是均匀的晶界也会导致真实晶界阻抗与砖层值之间存在明显差异。然而，在各种相关情况下，偏差不是很明显，甚至可能部分补偿，使得砖层模型在许多情况下仍然可以是合理的近似值。
Owing to their simplicity, brick layer models are frequently used to analyze the impedance spectra of ceramics. As a matter of fact, such models do not represent the real microstructure of the materials. In this contribution, we investigate how deviations from that idealized model influence the overall impedance for low-conducting grain boundaries. Finite element calculations reveal that even homogeneous grain boundaries can cause distinct differences between the true grain boundary impedance and the brick layer values. In various relevant cases, however, the deviations are not very pronounced and may even partly compensate such that the brick layer model can still be a reasonable approximation in many cases.