Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers.
Ultrafast electron diffraction optimized for studying structural dynamics in thin films and monolayers.
复制标题
超快电子衍射优化，用于研究薄膜和单层中的结构动力学。
DOI：
10.1063/1.4949538
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发表时间：
2016-05
期刊：
影响因子：
--
通讯作者：
Miller RJ
中科院分区：
文献类型：
--
作者：
Badali DS;Gengler RY;Miller RJ
本文介绍了一种专为研究自支撑薄膜和单分子膜的时间分辨衍射而设计的紧凑型电子源。通过将已建立的超快电子衍射技术扩展到“中等”能量区(1-10 千伏)，实现了对薄样品的灵敏度。非常紧凑的设计，加上低的束团电荷，允许在无透镜的几何图形中进行高质量的衍射。实验系统的测量和模拟特性显示出亚皮秒的时间分辨率，同时展示了从原子薄样品中产生高质量衍射图的能力。
A compact electron source specifically designed for time-resolved diffraction studies of free-standing thin films and monolayers is presented here. The sensitivity to thin samples is achieved by extending the established technique of ultrafast electron diffraction to the “medium” energy regime (1–10 kV). An extremely compact design, in combination with low bunch charges, allows for high quality diffraction in a lensless geometry. The measured and simulated characteristics of the experimental system reveal sub-picosecond temporal resolution, while demonstrating the ability to produce high quality diffraction patterns from atomically thin samples.