XPS and UPS study on band alignment at Pt-Zn-terminated ZnO(0001) interface
XPS and UPS study on band alignment at Pt-Zn-terminated ZnO(0001) interface
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DOI:
10.1016/j.apsusc.2011.08.095
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发表时间:
2011-11-01
影响因子:
6.7
通讯作者:
Nagata, Takahiro
中科院分区:
文献类型:
--
作者:
Blumentrit, Petr;Yoshitake, Michiko;Nagata, Takahiro
The interface between Pt and Zn-terminated ZnO(0 0 0 1) was investigated by X-ray and ultra violet photoelectron spectroscopy in order to examine electronic band alignment. An angle-resolved X-ray photoelectron spectroscopy measurement of the clean ZnO(0 0 0 1) surface has revealed a downward band bending by 0.25 eV. The results of the valence band analysis show that the work function and the valence band maximum of clean ZnO(0 0 0 1) were 4.49 eV and 2.79 eV, respectively. Platinum was then deposited in several deposition steps onto a clean ZnO(0 0 0 1) surface up to 0.6 nm in thickness. After the deposition, the binding energy of Zn 2p doublet peak was shifted towards lower value by 0.77 eV, and the measured work function changed to 5.51 eV. As a result, the Schottky barrier height of Pt/ZnO(0 0 0 1) interface was 1.11 eV. (C) 2011 Elsevier B.V. All rights reserved.