Classical treatment of parametric processes in a strong-coupling planar microcavity
Classical treatment of parametric processes in a strong-coupling planar microcavity
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强耦合平面微腔参数过程的经典处理
DOI：
10.1103/physrevb.63.193305
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发表时间：
2001
影响因子：
3.7
通讯作者：
D. Whittaker
中科院分区：
文献类型：
--
作者：
D. Whittaker
强耦合半导体微腔中的参量散射的经典处理方法很好地描述了最近的实验，在这些实验中已经证实了参量振子行为。该模型由一个耦合到外场驱动的腔模的非线性激子振子组成，它预测了参数振荡器的输出功率、阈值以下增益和光谱蓝移。
A classical treatment of parametric scattering in strong-coupling semiconductor microcavities is shown to provide a good description of recent experiments in which parametric oscillator behavior has been demonstrated. The model consists of a nonlinear excitonic oscillator coupled to a cavity mode that is driven by the external fields and predicts the output power, below threshold gain and spectral blueshifts of the parametric oscillator.