Radiation pattern characterisation setup for G-band planar Yagi antennas

Radiation pattern characterisation setup for G-band planar Yagi antennas
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G 波段平面八木天线的辐射方向图表征装置

DOI:
10.1049/ic.2014.0180
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发表时间:
2014
期刊:
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影响因子:
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通讯作者:
Alharbi K
Alharbi K
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文献类型:
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作者:
Alharbi K

文献摘要

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提出了一种G波段平面八木天线在片辐射方向图特性测试结构。它采用了在同一基板上制造的多个相同的平面八木天线(一个作为接收器,周围有多个发射器)。晶片上的测量是使用矢量网络分析仪(VNA)来测量不同接收器-发射器天线配置的辐射强度。测量的辐射方向图与模拟的辐射方向图吻合较好。所设计的平面八木天线在整个G频段显示了很宽的带宽(S11<-10分贝)。通过优化反射镜的几何形状,可以获得更高的前后比。
On-wafer radiation pattern characterisation test structure for G-band planar Yagi antennas is presented in this paper. It employs a number of identical planar Yagi antennas (one as a receiver and surrounded by multi transmitters) fabricated on the same substrate. On-wafer measurements are done using a Vector Network Analyser (VNA) to measure the radiation intensity at the different receiver-transmitter antenna configurations. Measured and simulated radiation patterns are in a good agreement. The designed planar Yagi antenna shows very wide bandwidth (S11< -10 dB) over the whole Gband. Higher front-to-back ratio could be obtained through optimised reflector geometry.