Electrical Property of Nano-Crystalline Silicon Thin-Films Prepared by Very High Frequency Plasma Deposition System
Electrical Property of Nano-Crystalline Silicon Thin-Films Prepared by Very High Frequency Plasma Deposition System
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甚高频等离子体沉积系统制备纳米晶硅薄膜的电学性能
DOI:
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发表时间:
2011
期刊:
影响因子:
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通讯作者:
and Shunri Oda
中科院分区:
文献类型:
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作者:
Yoshifumi Nakamine;Tetsuo Kodera;Ken Uchida;Mutsuko Hatano;and Shunri Oda