Imaging a buried interface by scanning tunneling spectroscopy of surface states in a metallic system
Imaging a buried interface by scanning tunneling spectroscopy of surface states in a metallic system
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通过扫描金属系统中表面态的隧道光谱对埋入界面进行成像
DOI：
10.1103/physrevb.72.233408
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发表时间：
2005
影响因子：
3.7
通讯作者：
D. Malterre
中科院分区：
文献类型：
--
作者：
C. Didiot;A. Vedeneev;Y. Fagot;B. Kierren;D. Malterre
我们提出了一种基于扫描隧道光谱的方法来获取Au（111）衬底上Ag薄膜的Shockley态的结构和化学信息，并对掩埋台阶衬底进行成像。使用的肖克利表面态带的能量的厚度依赖性，我们已经能够确定在表面上的膜的局部厚度，并推导出该系统的生长模式。我们还证明了退火下发生在掩埋衬底台阶边缘的合金化机制。我们的方法原则上可以适用于任何具有肖克利型表面态的外延金属系统。
We proposed a method based on scanning tunneling spectroscopy of the Shockley states in thin Ag films on Au(111) to get structural and chemical information and to image the buried stepped substrate. Using the thickness dependence of the energy of the Shockley surface state band, we have been able to determine the local thickness of the film over the surface and to derive the growth mode of this system. We also evidenced the alloying mechanism which occurs at the buried substrate step edges under annealing. Our method could in principle be applied to any epitaxial metallic systems having Shockley-type surface states.