Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy
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DOI：
10.1143/jjap.48.08jb22
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发表时间：
2009-08-01
影响因子：
1.5
通讯作者：
Takahashi, Takuji
中科院分区：
文献类型：
--
作者：
Hara, Kenji;Takahashi, Takuji
我们提出了一种用于光热（PT）测量的带有压阻悬臂的间歇接触模式原子力显微镜的双采样方法。该方法通过排除悬臂上压阻式传感器产生的光吸收信号中的串扰，实现了对样品热膨胀的灵敏检测。我们通过在Si和GaAs上测量的PT信号的激发光子能量依赖性证实了该方法的可行性。(C) 2009日本应用物理学会
We have proposed a dual sampling method in intermittent-contact-mode atomic force microscopy with a piezoresistive cantilever for photothermal (PT) measurements. This method realizes a sensitive detection of thermal expansion in a sample by excluding crosstalk from photoabsorption signals generated at the piezoresistive sensor on the cantilever. We have confirmed the feasibility of this method through the excitation photon energy dependence of the PT signal measured on Si and GaAs. (C) 2009 The Japan Society of Applied Physics