Temperature dependent phenomena in La1−xSrxMnO3 films studied by magnetic force microscopy
Temperature dependent phenomena in La1−xSrxMnO3 films studied by magnetic force microscopy
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通过磁力显微镜研究 La1−xSrxMnO3 薄膜中的温度依赖性现象
DOI：
10.1063/1.372827
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发表时间：
2000
期刊：
影响因子：
--
通讯作者：
M. Blamire
中科院分区：
文献类型：
--
作者：
Y. Soh;G. Aeppli;N. Mathur;M. Blamire
用磁力显微镜（MFM）研究了La1−xSrxMnO3薄膜的磁畴结构。通过使用可变温度样品台监测作为温度的函数的磁性图案的演变。在MFM图像中的磁对比度随着温度的升高而降低，并且随着系统接近膜的Tc而消失。在高于薄膜的Tc的温度下，在晶界周围检测到具有较高Tc的局部铁磁区域。我们把这种局部Tc的变化归因于薄膜中应变的局部变化。
Magnetic domain structure of La1−xSrxMnO3 films was studied using magnetic force microscopy (MFM). Evolution of the magnetic patterns was monitored as a function of temperature by using a variable temperature sample stage. The magnetic contrast in the MFM images decreases as the temperature is raised and vanishes as the system approaches the Tc of the film. At temperatures above the Tc of the film, local ferromagnetic regions with a higher Tc are detected around the grain boundaries. We attribute this variation in the local Tc to the local variation of strain in the film.