Atomic Structure Characterization of Stacking Faults on the {1-100} Plane in α-Alumina by Scanning Transmission Electron Microscopy

Atomic Structure Characterization of Stacking Faults on the {1-100} Plane in α-Alumina by Scanning Transmission Electron Microscopy
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扫描透射电子显微镜表征α-氧化铝{1-100}面上堆垛层错的原子结构

DOI:
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发表时间:
2016
期刊:
AIP-Conference Proceedings Series
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通讯作者:
and Y. Ikuhara
and Y. Ikuhara
中科院分区:
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文献类型:
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作者:
E. Tochigi;S. D. Findlay;E. Okunishi;T. Mizoguchi;A. Nakamura;N. Shibata;and Y. Ikuhara

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