A transmission electron microscopy procedure for in-situ straining of miniature pseudoelastic NiTi specimens
A transmission electron microscopy procedure for in-situ straining of miniature pseudoelastic NiTi specimens
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用于微型伪弹性 NiTi 样品原位应变的透射电子显微镜程序
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
G. Eggeler
中科院分区：
文献类型：
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作者：
J. Olbricht;M. Wagner;A. Condó;A. Dlouhý;C. Grossmann;A. Kröger;C. Somsen;G. Eggeler
摘要利用透射电子显微镜原位观察技术，可以直接观察NiTi形状记忆合金中应力诱发马氏体的形成和长大过程。本文件报告的发展，一个微型的测试程序，在现场应变实验与标本取自小部件。超细晶粒NiTi试样的变形的特征在于透射电子显微镜（在早期加载阶段）和光学显微镜（在较大的应变）。在试样中的复杂应变状态的互补有限元分析合理化为什么应力诱导马氏体相变首先发生在薄箔区域的试样，然后向试样的外缘蔓延。
Abstract The in-situ transmission electron microscopy technique allows direct observations of formation and growth of stress-induced martensite in pseudoelastic NiTi shape memory alloys. The present paper reports on the development of a miniature test procedure for in-situ straining experiments with specimens taken from small components. The deformation of an ultra-fine grained NiTi specimen is characterised by transmission electron microscopy (at early loading stages) and by optical microscopy (at larger strains). A complementary finite element analysis of the complex strain state in the specimen rationalises why the stress-induced martensitic transformation first occurs in the thin foil region of the specimen before spreading towards the outer rim of the specimen.