Defect-Orinted Testing
Defect-Orinted Testing
复制标题
面向缺陷的测试
DOI：
10.1007/0-387-29409-0_1
复制
发表时间：
2006
期刊：
影响因子：
--
通讯作者：
R. Aitken
中科院分区：
文献类型：
--
作者：
R. Aitken
The integrated circuit manufacturing process is imperfect, and as a result defects are introduced into some of the fabricated chips. Defects take a wide variety of forms, from localized spot defects, typically extra or missing material caused by contamination, to defects affecting much larger areas, such as transistor changes caused by implantation variation.Some defects affect circuit behavior. Testing is used to find these before products are shipped, in order to ensure high quality. Defect-oriented testing is a way to improve the efficiency of testing by targeting tests directly at the defects that cause incorrect circuit operation.
