Evaluating Young's Modulus of Single Yeast Cells Based on Compression Using an Atomic Force Microscope with a Flat Tip
Evaluating Young's Modulus of Single Yeast Cells Based on Compression Using an Atomic Force Microscope with a Flat Tip
复制标题
DOI：
10.1017/s1431927620024903
复制
发表时间：
2021-04-01
影响因子：
2.8
通讯作者：
Arai, Fumihito
中科院分区：
文献类型：
--
作者：
Chang, Di;Hirate, Takahiro;Arai, Fumihito
在这项研究中，原子力显微镜（AFM）与一个平头悬臂用于测量整个酵母细胞（Saccharomyces cerevisiae BY4741）的杨氏模量。从AFM获得的结果与使用微流控芯片压缩系统获得的结果相似。单个酵母细胞的力学性能是利用原子力显微镜检测酵母细胞力学性能的重要参数。传统研究采用带有尖锐悬臂尖端的原子力显微镜对细胞进行压痕，并测量力-压痕曲线，由此计算杨氏模量。然而，尖锐的尖端会带来问题，因为形状的变化会导致不同的结果，并且不能代表整个细胞的刚度。当评估酵母细胞的杨氏模量时，它可能导致缺乏更广泛的意义。在本报告中，我们证实了使用商业尖头与独特的扁平头测量聚（二甲基硅氧烷）头的压缩时获得的结果差异。利用该方法对酵母细胞整体进行压缩，并生成力-变形曲线。我们相信我们提出的方法是有效的评估整个酵母细胞的杨氏模量。
In this research, atomic force microscopy (AFM) with a flat tip cantilever is utilized to measure Young's modulus of a whole yeast cell (Saccharomyces cerevisiae BY4741). The results acquired from AFM are similar to those obtained using a microfluidic chip compression system. The mechanical properties of single yeast cells are important parameters which can be examined using AFM. Conventional studies apply AFM with a sharp cantilever tip to indent the cell and measure the force-indentation curve, from which Young's modulus can be calculated. However, sharp tips introduce problems because the shape variation can lead to a different result and cannot represent the stiffness of the whole cell. It can lead to a lack of broader meaning when evaluating Young's modulus of yeast cells. In this report, we confirm the differences in results obtained when measuring the compression of a poly(dimethylsiloxane) bead using a commercial sharp tip versus a unique flat tip. The flat tip effectively avoids tip-derived errors, so we use this method to compress whole yeast cells and generate a force-deformation curve. We believe our proposed method is effective for evaluating Young's modulus of whole yeast cells.