Fully automatic test program generation for microprocessor cores
Fully automatic test program generation for microprocessor cores
复制标题
微处理器内核的全自动测试程序生成
DOI：
10.1109/date.2003.1253736
复制
发表时间：
2003
期刊：
影响因子：
--
通讯作者：
Giovanni Squillero
中科院分区：
文献类型：
--
作者：
Fulvio Corno;G. Cumani;M. Reorda;Giovanni Squillero
微处理器内核是测试竞技场中的一个主要挑战：不仅它们的复杂性不断增加，而且它们的特定特性加剧了所有困难。嵌入在SoC中的微处理器更难测试，因为它的输入可能更难控制，它的行为可能更难观察。功能测试是一种有效的解决方案，它迫使微处理器执行合适的测试程序。本文提出了一种新的方法来自动测试程序生成利用进化范式。它克服了以前的方法的主要局限性，并提供了显着更好的结果。人工干预仅限于枚举所有汇编指令。优化器内部参数自适应，实验结果表明了该方法的有效性。
Microprocessor cores are a major challenge in the test arena: not only is their complexity always increasing, but also their specific characteristics intensify all difficulties. A microprocessor embedded inside a SoC is even harder to test since its input might be harder to control and its behavior may be harder to observe. Functional testing is an effective solution which consists in forcing the microprocessor to execute a suitable test program. This paper presents a new approach to automatic test program generation exploiting an evolutionary paradigm. It overcomes the main limitations of previous methodologies and provides significantly better results. Human intervention is limited to the enumeration of all assembly instructions. Also internal parameters of the optimizer are auto-adapted Experimental results show the effectiveness of the approach.
DOI：
10.1007/bfb0055923
发表时间：
1998
期刊：
--
影响因子：
--
作者：
Moshe Sipper
通讯作者：
Moshe Sipper