Simulation of the effects of coated material SEY property on output electron energy distribution and gain of microchannel plates

Simulation of the effects of coated material SEY property on output electron energy distribution and gain of microchannel plates
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DOI:
10.1016/j.nima.2016.10.014
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发表时间:
2016-12
影响因子:
1.4
通讯作者:
Lin Chen;Lin Chen;Wang Xingchao;Jinshou Tian;Jinshou Tian;Chunliang Liu;Liu Hulin;Ping Chen;Wei Yong-lin;S. Xiaofeng;Jiannin Sun;Si Shuguang;Xing Wang;Yu Lu;L. Tian;D. Hui;Lehui Guo
Lin Chen;Lin Chen;Wang Xingchao;Jinshou Tian;Jinshou Tian;Chunliang Liu;Liu Hulin;Ping Chen;Wei Yong-lin;S. Xiaofeng;Jiannin Sun;Si Shuguang;Xing Wang;Yu Lu;L. Tian;D. Hui;Lehui Guo
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Lin Chen;Lin Chen;Wang Xingchao;Jinshou Tian;Jinshou Tian;Chunliang Liu;Liu Hulin;Ping Chen;Wei Yong-lin;S. Xiaofeng;Jiannin Sun;Si Shuguang;Xing Wang;Yu Lu;L. Tian;D. Hui;Lehui Guo

文献摘要

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微通道板(MCP)像增强器在获得高空间分辨率时,输出电子的出射能量分布(EDOE)中存在长尾效应。现有的解决方案是增加MCP输出电极的穿透深度,这将导致严重的增益降低。在MCP输出电极上涂覆有效的二次电子产额(SEY)材料是一种有效的方法,可以在不影响增益的情况下抑制EDOE中的不利尾部分量。在我们的工作中,一个三维MCP单通道模型在CST STUDIO SUITE开发系统的EDOE和增益的依赖关系的涂层材料的SEY性能,基于有限积分技术和蒙特卡罗方法。结果表明,除了镀膜材料的高SEY外,峰值SEY对应的低入射能量是影响倍增末期电子产额和抑制输出能量扩散的另一个重要因素。
To obtain a high spatial resolution of a image intensifier based on microchannel plate (MCP), the long tail in the exit energy distribution of the output electrons (EDOE) is undesirable. The existing solution is increasing the penetration depth of the MCP output electrode, which will result in a serious gain reduction. Coating the MCP output electrode with efficient secondary electron yield (SEY) materials is supposed to be an effective approach to suppress the unfavorable tail component in the EDOE without negative effects on the gain. In our work, a three-dimensional MCP single channel model is developed in CST STUDIO SUITE to systematically investigate the dependences of the EDOE and the gain on the SEY property of the coated material, based on the Finite Integral Technique and Monte Carlo method. The results show that besides the high SEY of the coated material, the low incident energy corresponding to the peak SEY is another essential element affecting the electron yield in the final stage of multiplication and suppressing the output energy spread.