Time-resolved X-ray diffraction study of the structural dynamics in an epitaxial ferroelectric thin Pb(Zr0.2Ti0.8)O3 film induced by sub-coercive fields
Time-resolved X-ray diffraction study of the structural dynamics in an epitaxial ferroelectric thin Pb(Zr0.2Ti0.8)O3 film induced by sub-coercive fields
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DOI：
10.1063/1.5084104
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发表时间：
2019-04-22
影响因子：
4
通讯作者：
Bargheer, M.
中科院分区：
文献类型：
--
作者：
Kwamen, C.;Roessle, M.;Bargheer, M.
利用时间分辨X射线衍射研究了四元铁电锆钛酸铅薄膜在亚矫顽场和超矫顽场作用下的结构动力学随电场的变化。在向预极化薄膜电容器施加外部场期间，真实的时间监测畴成核和生长。我们提出了所观察到的对称002布拉格反射的面内峰宽的加宽作为畴无序的指标，并讨论了改变测得的峰强度的过程。亚矫顽场翻转导致剩余的无序畴结构。由AIP Publishing授权出版。
The electric field-dependence of structural dynamics in a tetragonal ferroelectric lead zirconate titanate thin film is investigated under subcoercive and above-coercive fields using time-resolved X-ray diffraction. The domain nucleation and growth are monitored in real time during the application of an external field to the prepoled thin film capacitor. We propose the observed broadening of the in-plane peak width of the symmetric 002 Bragg reflection as an indicator of the domain disorder and discuss the processes that change the measured peak intensity. Subcoercive field switching results in remnant disordered domain configurations. Published under license by AIP Publishing.