M.Terauchi: "Detection of characteristic signals from As doped (less than 1 at.%) regions of silicon by transmission electron microscopy and convergent-beam election diffraction"Journal of Electron Microscopy. vol.52(5). 441-448 (2003)
M.Terauchi: "Detection of characteristic signals from As doped (less than 1 at.%) regions of silicon by transmission electron microscopy and convergent-beam election diffraction"Journal of Electron Microscopy. vol.52(5). 441-448 (2003)
复制标题
M.Terauchi:%20"检测%20of%20characteristic%20signals%20from%20As%20ulated%20(少于%20%201%20at.%)%20regions%20of%20silicon%20by%20transmission%20电子%20microscopy%20and%
DOI：
--
复制
发表时间：
--
期刊：
影响因子：
--
通讯作者：
中科院分区：
文献类型：
--
作者：
