Responsivity calibration of the extreme ultraviolet spectrometer in the range of 175-435 Å
Responsivity calibration of the extreme ultraviolet spectrometer in the range of 175-435 Å
复制标题
极紫外光谱仪在175-435°范围内的响应度校准
DOI:
10.1063/1.4982798
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发表时间:
2017-04
期刊:
影响因子:
1.6
通讯作者:
Y. Zou
中科院分区:
文献类型:
--
作者:
B.Tu;M. C. Li;Q. F. Lu;Z. Z. Zhao;Y. Shen;Y. Yang;D. Lu;K. Yao;C. Y. Chen;H. J. Zhou;T. L. Huo;J.Xiao;R. Hutton;Y. Zou
We reported the relative responsivity calibration of the grazing-incidence flat-field EUV spectrometer between 175 and 435 Å by means of two methods. The first method is implemented by measuring the diffraction efficiency of the grating with synchrotron radiation light source. Considering the transmission efficiency and quantum efficiency of the other optical components in the spectrometer, the total responsivity was then obtained. The second one was carried out by measuring line emissions from C3+, N4+ and O3+ ions at Shanghai high temperature super conductor electron beam ion trap (SH-HtscEBIT). The EUV spectra were also simulated theoretically via a collisional radiative model. In the calculation, the second-order relativistic many-body perturbation theory approach based on the flexible atomic code was used to calculate the energy levels and transition rates; the close-coupling R-matrix approach and relativistic distorted wave method were utilized to calculate the collision strength of electron impact excitation. In comparison with the spectroscopic measurements at EBIT device, the differences between the measured and simulated relative line intensities were obtained. The responsivity calibration for the spectrometer was then achieved by a 3rd degree polynomial function fitting. Our measurement shows that the responsivity between 175 and 435 Å varies by factor of ∼ 46. The two results of calibration demonstrated a consistency within an average deviation of 24%. In addition, an evaluation of our calculations on C iv, N v and O iv line emissions in this wavelength region was given.
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DOI:
10.1063/1.4876597
发表时间:
2014
期刊:
Review of Scientific Instruments
影响因子:
--
作者:
Zhan Shi;Ruifeng Zhao;Wenxian Li;BingshengTu;Yang Yang;Jun Xiao;Sven Huldt;Roger Hutton;Yaming Zou
通讯作者:
Yaming Zou
影响因子:
1.6
作者:
Y. Okamoto;M. Yoshikawa;N. Yamaguchi;C. Watabe;T. Tamano;E. Kawamori;Y. Watanabe;T. Furukawa
通讯作者:
Y. Okamoto;M. Yoshikawa;N. Yamaguchi;C. Watabe;T. Tamano;E. Kawamori;Y. Watanabe;T. Furukawa
影响因子:
2.5
作者:
M. Yoshikawa;N. Yamaguchi;T. Aota;K. Ikeda;Y. Okamoto;K. Yatsu;T. Tamano
通讯作者:
M. Yoshikawa;N. Yamaguchi;T. Aota;K. Ikeda;Y. Okamoto;K. Yatsu;T. Tamano
DOI:
10.1086/429879
发表时间:
2005-06
期刊:
The Astrophysical Journal
影响因子:
--
作者:
J. Lepson;P. Beiersdorfer;E. Behar;S. Kahn
通讯作者:
J. Lepson;P. Beiersdorfer;E. Behar;S. Kahn
DOI:
10.1088/0953-4075/47/17/175002
发表时间:
2014-08
期刊:
Journal of Physics B: Atomic, Molecular and Optical Physics
影响因子:
--
作者:
M. L. Qiu;R. Zhao;X. Guo;Z. Z. Zhao-Z.;W. Li;S. Du;J. Xiao;K. Yao;C. Chen;R. Hutton
通讯作者:
M. L. Qiu;R. Zhao;X. Guo;Z. Z. Zhao-Z.;W. Li;S. Du;J. Xiao;K. Yao;C. Chen;R. Hutton