Frontiers of in situ electron microscopy
Frontiers of in situ electron microscopy
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DOI：
10.1557/mrs.2014.305
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发表时间：
2015-01
期刊：
影响因子：
5
通讯作者：
Haimei Zheng;Y. Meng;Yimei Zhu
中科院分区：
文献类型：
--
作者：
Haimei Zheng;Y. Meng;Yimei Zhu
原位电子显微镜已成为材料表征的重要工具。它提供了有关材料在转变过程中的结构动力学以及将材料的结构和属性关联起来的能力的关键信息。随着仪器技术的进步，包括像差校正光学技术、样品环境控制技术、样品台技术、快速灵敏的数据采集技术等，电子显微镜的原位表征变得更加强大。本文简要介绍了原位瞬变电磁法的研究现状和发展前景。文章还介绍了本期《MRS简报》中探索原位电子显微镜前沿的6篇文章，包括液体和气体环境的透射电子显微镜、动态四维透射电子显微镜、纳米力学和铁电磁畴转换的研究，以及轻元素(即碳原子)和单个缺陷的最新原子成像。
In situ transmission electron microscopy (TEM) has become an increasingly important tool for materials characterization. It provides key information on the structural dynamics of a material during transformations and the ability to correlate a material’s structure and properties. With the recent advances in instrumentation, including aberration-corrected optics, sample environment control, the sample stage, and fast and sensitive data acquisition, in situ TEM characterization has become more powerful. In this article, a brief review of the current status and future opportunities of in situ TEM is provided. The article also introduces the six articles in this issue of MRS Bulletin exploring the frontiers of in situ electron microscopy, including liquid and gas environmental TEM, dynamic four-dimensional TEM, studies on nanomechanics and ferroelectric domain switching, and state-of-the-art atomic imaging of light elements (i.e., carbon atoms) and individual defects.