Electron subbands and transport properties in inversion layers of InAs and InP.
Electron subbands and transport properties in inversion layers of InAs and InP.
复制标题
InAs 和 InP 反演层中的电子子带和传输特性。
DOI:
10.1103/physrevb.32.5280
复制
发表时间:
1985
期刊:
影响因子:
--
通讯作者:
Yamaguchi
中科院分区:
文献类型:
--
作者:
Yamaguchi
Subband structures and electron transport are systematically investigated in the two-dimensional inversion layers on InAs and InP metal-insulator-semiconductor field-effect transistors. Hybrid quantum oscillations of conductivity under a strong magnetic field reveal that the two-subband conduction state is realized above an electron concentration N s of 1.4× 10 12 and 3.8× 10 12 cm− 2 for InAs (acceptor concentration N A= 1× 10 17 cm− 3) and InP (N A= 1.7× 10 16 cm− 3), respectively. Field-effect mobility is observed to decrease abruptly at the onset of the two-subband conduction state at low temperatures. This remarkable effect is due to intersubband scattering. Electron mobility in inversion layers on these III-V compounds is also found to be limited mainly by three scattering mechanisms: screened Coulomb scattering due to the charged interface states at low N s values, defect scattering due to the out-diffusion of group-V atoms at intermediate N s values, and surface roughness scattering at high N s values. Additionally, negative magnetoresistance is observed due to the weak localization effect in the two-dimensional systems. Positive magnetoresistance is also observed in InAs, due to the spin-orbit interaction with a large absolute value of an effective g factor. Finally, intersubband scattering is found to give rise to a remarkable effect on the weak localization.