Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments
Multimode scanning X-ray diffraction microscopy for diamond anvil cell experiments
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DOI：
10.1063/1.5057518
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发表时间：
2019-02-01
影响因子：
1.6
通讯作者：
Shen, Guoyin
中科院分区：
文献类型：
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作者：
Hrubiak, Rostislav;Smith, Jesse S.;Shen, Guoyin
我们设计并实现了一个新的实验系统，用于在高压下快速绘制晶体结构和材料的其他结构特征，在高压协作访问小组，先进光子源16区。该系统利用扫描x射线衍射显微镜（SXDM），并针对金刚石砧细胞设备进行了优化。在SXDM中，通过对样品进行微聚焦x射线束的飞行扫描，从二维网格上的点以正向散射几何形状收集x射线衍射（XRD）。在样品连续运动过程中，使用与样品定位器同步的快速（毫秒）x射线区域检测器进行XRD记录，从而为SXDM提供高效的数据收集。利用SXDM系统开发了一种新的计算机程序——x射线衍射成像（XDI）。XDI程序为SXDM图像的构建和显示提供了图形界面，可实现以下几种模式：(1)基于结构信息的相位映射，(2)基于状态方程的压力可视化，(3)基于峰形参数的微观结构特征映射，(4)基于峰形参数的晶粒尺寸和优选取向。XDI是一个独立的程序，通常可用于显示SXDM映像。以高压条件下的铁和锆样品为例，说明了SXDM的应用。由AIP出版社授权出版。
We have designed and implemented a new experimental system for fast mapping of crystal structures and other structural features of materials under high pressure at the High Pressure Collaborative Access Team, Sector 16 of the Advanced Photon Source. The system utilizes scanning X-ray diffraction microscopy (SXDM) and is optimized for use with diamond anvil cell devices. In SXDM, the X-ray diffraction (XRD) is collected in a forward scattering geometry from points on a two-dimensional grid by fly-scanning the sample with respect to a micro-focused X-ray beam. The recording of XRD is made during the continuous motion of the sample using a fast (millisecond) X-ray area detector in synchrony with the sample positioners, resulting in a highly efficient data collection for SXDM. A new computer program, X-ray Diffractive Imaging (XDI), has been developed with the SXDM system. The XDI program provides a graphical interface for constructing and displaying the SXDM images in several modes: (1) phase mapping based on structural information, (2) pressure visualization based on the equation of state, (3) microstructural features mapping based on peak shape parameters, and (4) grain size and preferred-orientation based on peak shape parameters. The XDI is a standalone program and can be generally used for displaying SXDM images. Two examples of iron and zirconium samples under high pressure are presented to demonstrate the applications of SXDM. Published under license by AIP Publishing.