Electron beam excitation assisted optical microscope with ultra-high resolution
Electron beam excitation assisted optical microscope with ultra-high resolution
复制标题
DOI：
10.1364/oe.18.012897
复制
发表时间：
2010-06-07
期刊：
影响因子：
3.8
通讯作者：
Kawata, Yoshimasa
中科院分区：
文献类型：
--
作者：
Inami, Wataru;Nakajima, Kentaro;Kawata, Yoshimasa
我们提出了电子束激发辅助光学显微镜，并展示了其分辨率高于50 nm。在显微镜中，几纳米大小的光源被发光薄膜中的聚焦电子束激发。显微镜可以观察活体生物标本在各种环境（例如空气或液体）中的动态行为。纳米光源的扫描速度比传统近场扫描光学显微镜更快。显微镜能够观察光学常数，如吸收、折射率、偏振及其在纳米尺度上的动态行为。该显微镜开启了纳米技术和纳米科学领域新的显微镜应用。 (C) 2010 美国光学学会
We propose electron beam excitation assisted optical microscope, and demonstrated its resolution higher than 50 nm. In the microscope, a light source in a few nanometers size is excited by focused electron beam in a luminescent film. The microscope makes it possible to observe dynamic behavior of living biological specimens in various surroundings, such as air or liquids. Scan speed of the nanometric light source is faster than that in conventional near-field scanning optical microscopes. The microscope enables to observe optical constants such as absorption, refractive index, polarization, and their dynamic behavior on a nanometric scale. The microscope opens new microscopy applications in nano-technology and nano-science. (C) 2010 Optical Society of America