Radiation test on FD-SOI Readout ASIC of Pair-monitor for ILC
Radiation test on FD-SOI Readout ASIC of Pair-monitor for ILC
复制标题
ILC 配对监视器 FD-SOI 读出 ASIC 的辐射测试
DOI:
10.1016/j.nima.2010.12.149
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发表时间:
2011
期刊:
影响因子:
--
通讯作者:
Y. Sato
中科院分区:
文献类型:
--
作者:
大友祐一;市川雄一;佐藤智哉;坂本雄;小島修一郎;鈴木貴大;白井葉月;近森正敏;宮武裕和;彦田絵里;七尾翼;鈴木都文;土屋真人;井上壮志;古川武;吉見彰洋;C. P. Bidinosti;猪野隆;上野秀樹;松尾由賀利;福山武志;旭耕一郎;保田賢輔;富田賢吾;黄坤賢;大饗千彰,植竹智,久間晋,笹尾登,高橋弘紀,田中実,中嶋享,中島優夢,中野逸夫,南條創,福見敦,山口琢也,湯浅一生,吉見彰洋,吉村太彦;Y. Sato
The pair-monitor is a silicon pixel device that measures the beam profile at the interaction point of the International Linear Collider. It extracts information from the directional distribution of a large number of electron–positron pairs created by collision of bunches, and is required to tolerate radiation dose of about a few Mrad/year. We developed a prototype ASIC with OKI Semiconductor Co., Ltd. 0.2‐μm fully depleted SOI (FD-SOI) CMOS process and studied its radiation tolerance. In this paper, we describe the design of the readout circuit briefly and present the result of irradiation tests.