CMOS Smart Sensor for Monitoring the Quality of Perishables
CMOS Smart Sensor for Monitoring the Quality of Perishables
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DOI：
10.1109/jssc.2007.891676
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发表时间：
2007-03
影响因子：
5.4
通讯作者：
K. Ueno;T. Hirose;T. Asai;Y. Amemiya
中科院分区：
文献类型：
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作者：
K. Ueno;T. Hirose;T. Asai;Y. Amemiya
我们开发了一种CMOS集成电路传感器，用于监测易腐食品质量随环境温度的变化。我们的传感器利用MOSFET中亚阈值电流的温度依赖性类似于易腐物质的降解这一事实。传感器附着在农产品和海产品等易腐商品上，并随商品沿着从生产者分发给消费者。在配送过程中，传感器测量周围的温度，并模拟温度引起的货物降解。通过阅读传感器的输出，消费者可以确定商品是否新鲜。我们的传感器由亚阈值CMOS电路组成，具有10 μ W或更低的低功耗
We developed a CMOS integrated-circuit sensor to monitor the change in quality of perishables that depends on surrounding temperatures. Our sensor makes use of the fact that the temperature dependence of the subthreshold current in MOSFETs is analogous to that of the degradation of perishables. The sensor is attached to perishable goods such as farm and marine products and is distributed from producers to consumers along with the goods. During their distribution process, the sensor measures the surrounding temperatures and emulates the degradation of the goods caused by the temperature. By reading the output of the sensor, consumers can determine whether the goods are fresh or not. Our sensor consists of subthreshold CMOS circuits with a low-power consumption of 10 muW or lower