Dual-Sweep Frequency Scanning Interferometry Using Four Wave Mixing
Dual-Sweep Frequency Scanning Interferometry Using Four Wave Mixing
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DOI：
10.1109/lpt.2015.2390779
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发表时间：
2015-04
影响因子：
2.6
通讯作者：
J. J. Martínez-J.;M. A. Campbell;M. Warden;E. Hughes;N. Copner;A. Lewis
中科院分区：
文献类型：
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作者：
J. J. Martínez-J.;M. A. Campbell;M. Warden;E. Hughes;N. Copner;A. Lewis
频率扫描干涉术是一种众所周知的测量到反射目标距离的技术。然而，在有限的测量时间内，光路长度的变化严重限制了该方法在现实环境中的适用性。通过使用第二个扫频源，测量结果不会受到这些变化的影响。使用第二个来源意味着成本和复杂性的极大增加。在这封信中，我们探讨了用四波混频产生二次扫频源的可能性。这大大减少了成本的增加，并解决了双激光系统经常遇到的同步问题。已经建立了一个原型，并针对光路长度的诱导变化进行了测试，证明了该技术在工业环境中改进距离测量的能力。
Frequency scanning interferometry is a well-known technique to measure the distance to a reflecting target. However, variations in the optical path length during the finite measurement time severely limit the applicability of the method in real-world environments. By the use of a second swept source measurements become immune to these variations. The use of a second source implies a great increase in costs and complexity. In this letter, we explore the possibility of using four wave mixing for the generation of the secondary swept frequency source. This greatly reduces the increase in costs and solves the synchronization issues often encountered by dual laser systems. A prototype has been built and tested against induced variations in the optical path length, proving the ability of the technique to improve distance measurements in industrial environments.