Numerical Analysis of Influence of Surface Barrier on Current-Voltage Characteristics for Narrow Superconducting Lines
Numerical Analysis of Influence of Surface Barrier on Current-Voltage Characteristics for Narrow Superconducting Lines
复制标题
表面势垒对窄超导线电流电压特性影响的数值分析
DOI：
10.1143/jjap.34.l408
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发表时间：
1995
影响因子：
1.5
通讯作者：
H. Hayakawa
中科院分区：
文献类型：
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作者：
H. Andoh;M. Kusunoki;A. Fujimaki;H. Hayakawa
本文从理论上计算了超导窄线的临界电流密度随线宽的变化以及电压随温度的变化关系。超导窄线的临界电流随着窄线的变窄而逐渐增大。本文讨论了超导窄线的表面势垒，以便理解超导窄线临界电流的逐渐增加。此外，为了理解超导窄线电压的温度依赖性，讨论了热激活磁通线越过表面势垒的情况。采用表面势垒的计算结果与实验结果吻合较好。
The variation of critical current density with reduced line width and the temperature dependence of voltage for superconducting narrow lines are calculated theoretically. Critical currents of superconducting narrow lines increase progressively as the lines become narrower. The surface barriers for superconducting narrow lines are discussed in order to understand the progressive increase in critical currents of superconducting narrow lines. Furthermore, the thermally activated flux lines jumping over the surface barrier are discussed in order to understand the temperature dependence of voltage for superconducting narrow lines. The results of calculation using the surface barriers agree well with experimental results.
H.Akaike：“使用聚焦离子束对超导铌薄膜进行亚微米级图案化。”
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