Generation of Polythiophene Micropatterns by Scanning Electrochemical Microscopy

Generation of Polythiophene Micropatterns by Scanning Electrochemical Microscopy
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DOI:
10.1021/cm001062r
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发表时间:
2001-02
影响因子:
8.6
通讯作者:
C. Marck;K. Borgwarth;J. Heinze
C. Marck;K. Borgwarth;J. Heinze
中科院分区:
材料科学2区
文献类型:
--
作者:
C. Marck;K. Borgwarth;J. Heinze

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使用扫描电化学显微镜(SECM)被证明是导电聚合物微沉积的有效工具。提出并讨论了聚噻吩局部聚合的新概念。溶解在溶液中的单体被聚合到氧化二氧化锰表面上,二氧化锰表面被尖端产生的质子局部激活。由于采用了化学透镜,分辨率提高了五倍。与质子反应的清除剂的加入对质子的扩散场产生了显著的聚焦效应。在这些条件下,使用10 μm Pt电极实现了低至8 μm的分辨率:该图案比用于生成它的工具要小。我们研究了清除剂浓度、尖端表面距离和扫描速率对结构宽度的影响。然后用SECM和光学手段成功地对得到的图案进行了成像。
The use of the scanning electrochemical microscope (SECM) is shown to be an effective tool for microdeposition of conducting polymers. A new concept of local polymerization applied to polythiophene is developed and discussed. The monomer dissolved in the solution is polymerized onto an oxidizing manganese dioxide surface, which is locally activated by tip-generated protons. An increase in resolution by a factor of 5 has been accomplished by the introduction of a chemical lens. The addition of a scavenger that reacts with the protons produced a significant focusing effect on the proton's diffusion field. Under these conditions, the resolution was achieved down to 8 μm with a 10-μm Pt electrode: the pattern was smaller than the tool used to generate it. We studied the effects of scavenger concentration, tip−surface distance, and scan rate on the structure's width. The patterns obtained were then successfully imaged by SECM and optical means.