High Resolution ADF-STEM Imaging Application for Organic Crystals
High Resolution ADF-STEM Imaging Application for Organic Crystals
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DOI：
10.1080/15421400802330663
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发表时间：
2008-01-01
影响因子：
0.7
通讯作者：
Isoda, Seiji
中科院分区：
文献类型：
--
作者：
Haruta, Mitsutaka;Yoshida, Kaname;Isoda, Seiji
采用高分辨率环形暗场扫描透射电子显微镜（ADF-STEM）成像技术对有机晶体进行结构观察，获得定量的原子分辨图像。特别是，低角度环形暗场方法（LAADF-STEM）被发现对辐射敏感的有机材料非常有利，因为可以利用更强的热漫射散射进行成像。在几个有机晶体中证明了在原子分辨率下有机分子的定量z对比图像。
High-resolution annular dark-field scanning transmission electron microscopy (ADF-STEM) imaging was applied for structural observations of organic crystals so as to achieve quantitative atomically resolved images. In particular, a low angle annular dark-field method (LAADF-STEM) was found to be highly advantageous for radiation sensitive organic materials, because stronger thermal diffuse scatterings can be utilized for imaging. So called quantitative Z-contrast images of organic molecules at atomic resolution were demonstrated in several organic crystals.