Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
Automated nanocrystal orientation and phase mapping in the transmission electron microscope on the basis of precession electron diffraction
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DOI：
10.1524/zkri.2010.1205
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发表时间：
2010-01-01
影响因子：
1.2
通讯作者：
Moeck, Peter
中科院分区：
文献类型：
--
作者：
Rauch, Edgar F.;Portillo, Joaquin;Moeck, Peter
描述了一种用于在透射电子显微镜中绘制晶体相和取向的自动化技术。它主要是基于从电子衍射斑点图案中提取的投影倒易晶格几何形状。旋进电子衍射图特别适用于此目的。所需的硬件允许初级电子束在晶体样品上的扫描进动运动，并且可以与任何较旧或较新的中压透射电子显微镜（TEM）连接。实验获得的晶体相位和取向图显示了各种样品。全面的商业和开放存取的晶体学数据库可用于支持晶体相鉴定过程，并简要提及。
An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope is described. It is primarily based on the projected reciprocal lattice geometry that is extracted from electron diffraction spot patterns. Precession electron diffraction patterns are especially useful for this purpose. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any older or newer mid-voltage transmission electron microscope (TEM). Experimentally obtained crystal phase and orientation maps are shown for a variety of samples. Comprehensive commercial and open-access crystallographic databases may be used in support of the nanocrystal phase identification process and are briefly mentioned.