Akira Usami: "Material and Process Learning by Non-Contact Characterization of Minority Carrier Lifetime and Surface Recombination Condition (invited paper)" IEEE International Conference on Microelectronic Test Structures, March 18-20 1991. 1-10 (1991)
Akira Usami: "Material and Process Learning by Non-Contact Characterization of Minority Carrier Lifetime and Surface Recombination Condition (invited paper)" IEEE International Conference on Microelectronic Test Structures, March 18-20 1991. 1-10 (1991)
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Akira Usami：“Material and Process Learning by Non-Contact Characterization of Minority Carrier Lifetime and Surface Recombination Condition (invited paper)” IEEE 国际微电子测试结构会议，1991 年 3 月 18-20 日。1-10 (1991)
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