Measurement of the linewidth enhancement factor of semiconductor lasers based on the optical, feedback self-mixing effect
Measurement of the linewidth enhancement factor of semiconductor lasers based on the optical, feedback self-mixing effect
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DOI：
10.1109/lpt.2004.824631
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发表时间：
2004-04-01
影响因子：
2.6
通讯作者：
Donati, S
中科院分区：
文献类型：
--
作者：
Yu, Y;Giuliani, G;Donati, S
提出了一种基于干涉自混合效应测量半导体激光器线宽增强系数的新方法。这是一种快速且易于执行的方法，不需要射频或光谱测量。发射光的一小部分由正弦波形驱动的远程目标反向反射到激光腔中。根据著名的Lang-Kobayashi理论，返回场和激光场的混合产生干涉波形形式的光输出功率调制，其形状取决于光反馈强度和线宽增强因子alpha。我们证明了α的值可以从干涉波形的两个特征时间间隔的简单测量中得到。在不同的激光二极管上得到的实验结果表明，精度为+/- 6.5%。
A new method for the measurement of the linewidth enhancement factor of semiconductor lasers is presented, based on the interferometric self-mixing effect. It is a fast and easy to perform method that does not require radio frequency nor optical spectrum measurements. A small fraction of the emitted light is backreflected into the laser cavity by a remote target driven by a sine waveform. The mixing of the returned and the lasing fields generates a modulation of the optical output power in the form of an interferometric waveform, with a shape that depends on the optical feedback strength and, the linewidth enhancement factor alpha, according to the well-known Lang-Kobayashi theory. We show that the value of alpha can be retrieved from a simple measurement of two characteristic time intervals of the interferometric waveform. Experimental results obtained on different laser diodes show an accuracy of +/- 6.5%.