HIGH-RESOLUTION OCDR FOR TESTING INTEGRATED-OPTICAL WAVE-GUIDES - DISPERSION-CORRUPTED EXPERIMENTAL-DATA CORRECTED BY A NUMERICAL ALGORITHM
HIGH-RESOLUTION OCDR FOR TESTING INTEGRATED-OPTICAL WAVE-GUIDES - DISPERSION-CORRUPTED EXPERIMENTAL-DATA CORRECTED BY A NUMERICAL ALGORITHM
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DOI：
10.1109/50.97637
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发表时间：
1991-11-01
影响因子：
4.7
通讯作者：
BRINKMEYER, E
中科院分区：
文献类型：
--
作者：
KOHLHAAS, A;FROMCHEN, C;BRINKMEYER, E
Micrometer resolution in reflectometric measurements for testing integrated optical devices cannot in general be maintained along the waveguides because of dispersion effects. Even for short waveguides with length of only a few centimeters the spatial resolution may be deteriorated by a factor of up to 100. A numerical algorithm is presented and applied to dispersion-corrupted experimental data taken by coherence domain reflectometric measurements. It results in a retrieval of micrometer resolution and an enhanced dynamic range.
