On the relation between rough set reducts and typical testors

On the relation between rough set reducts and typical testors
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DOI:
10.1016/j.ins.2014.09.045
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发表时间:
2015-02
期刊:
Inf. Sci.
影响因子:
--
通讯作者:
M. Lazo-Cortés;José Francisco Martínez Trinidad;J. A. Carrasco-Ochoa;G. Sánchez-Díaz
M. Lazo-Cortés;José Francisco Martínez Trinidad;J. A. Carrasco-Ochoa;G. Sánchez-Díaz
中科院分区:
其他
文献类型:
--
作者:
M. Lazo-Cortés;José Francisco Martínez Trinidad;J. A. Carrasco-Ochoa;G. Sánchez-Díaz

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本文从逻辑组合模式识别的角度出发,研究了粗糙集约简与典型测试集之间的关系。定义,评论和意见正式介绍和支持的说明性例子。此外,阐述并证明了表示约简与典型测试子之间理论关系的一些定理。我们还讨论了这些关系的几个实际应用,可以相互丰富这两个领域的研究和应用的发展。虽然我们的研究集中在经典的概念之间的关系的测试者和还原,我们的研究可以扩展到包括其他类型的测试者和还原。
This paper studies the relations between rough set reducts and typical testors from the so-called logical combinatorial approach to pattern recognition. Definitions, comments and observations are formally introduced and supported by illustrative examples. Furthermore, some theorems expressing theoretical relations between reducts and typical testors are enunciated and proved. We also discuss several practical applications of these relations that can mutually enrich the development of research and applications in both areas. Although we focus on the relation between the classical concepts of testor and reduct, our study can be expanded to include other types of testors and reducts.