Atomic-resolution measurement of oxygen concentration in oxide materials
Atomic-resolution measurement of oxygen concentration in oxide materials
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DOI：
10.1126/science.1093617
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发表时间：
2004-03-26
期刊：
影响因子：
56.9
通讯作者：
Urban, K
中科院分区：
文献类型：
--
作者：
Jia, CL;Urban, K
在像差校正的透射电子显微镜下，利用物镜负球差的高分辨率成像，我们以原子分辨率测量了BaTiO(3)薄膜中Sigma3{111}孪晶界中的氧浓度。平均68%的边界氧位点被占据，其余的是空的。由此形成的改性Ti(2)O(9)基团单元降低了晶界能，并提供了一种通过形成纳米孪晶片结构来容纳缺氧材料中出现的氧空位的方法。原子分辨测量技术为研究电子特性敏感地依赖于局部氧含量的氧化物材料提供了潜力。
Using high-resolution imaging at negative spherical aberration of the objective lens in an aberration-corrected transmission electron microscope, we measure the concentration of oxygen in Sigma3{111} twin boundaries in BaTiO(3) thin films at atomic resolution. On average, 68% of the boundary oxygen sites are occupied, and the others are left vacant. The modified Ti(2)O(9) group unit thus formed reduces the grain boundary energy and provides a way of accommodating oxygen vacancies occurring in oxygen-deficient material by the formation of a nanotwin lamellae structure. The atomically resolved measurement technique offers the potential for studies on oxide materials in which the electronic properties sensitively depend on the local oxygen content.